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品牌:
- Advanced Energy
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- Ancal Inc
- Angstrom Inc
- Applied Analytics Inc
- Applied NanoFluorescence LLC
- Applied Research & Photonics Inc
- Applied Rigaku Technologies Inc Div of Rigaku Corp
- Bakman Technologies
- Berkeley Nucleonics Corp
- Bodkin Design and Engineering
- Brandywine Photonics
- Bridger Photonics Inc
- Capacitec Inc
- Capovani Brothers Inc
- Cargille Labs
- Carl Zeiss Microscopy LLC
- Cascade Technologies
- Catalina Scientific Instruments
- Complete Inspection Systems Inc
- Connected Fibers
- DFM Engineering Inc
- Direct Optical Research Co
- D&P Instruments
- Dunwell Tech
- 爱特蒙特光学
- Eltec Instruments Inc
- ENMET
- Femtochrome Research Inc
- Fischer Technology Inc
- Fort Wayne Wire Die Inc
- Luna Innovations
- GenScope
- GigaMat Technologies Inc
- GOW-MAC Instrument Co
- Gradient Lens Corporation
- Guided Wave Inc
- Highland Technology
- Idealab Inc
- Infinity Photo-Optical
- InPhotonics Inc
- Interferometric Optics
- International Light Technologies
- Intracellular Imaging
- ISS Inc
- JADAK, a Novanta Co
- JEOL USA Inc
- Kaiser Optical Systems Inc
- Kasalis
- L3Harris Technologies, Inc.
- Kiyohara Optics USA
- Laser Probe Inc
- Leica Microsystems Inc
- Lenox Instrument Co
- LI-COR Inc
- Lion Precision
- Logos Systems
- M3 Measurement Solutions
- Macken Instruments Inc
- Mad City Labs
- Martin Froeschner & Associates
- Max Levy Autograph Inc
- MBF Bioscience
- McBain Systems
- McPherson
- Mesa Photonics LLC
- Metrohm USA
- MicroVision Inc
- Midac Corp
- Montana Instruments Corp
- NANOVEA
- Nikon Instruments
- OAI
- OLIS Inc
- Ono Sokki Technology Inc
- Optical Data Associates LLC
- Optical Perspectives Group, LLC
- Optical Wavelength Laboratories
- Optimark Fiber Optics
- Optodyne Inc
- OptoKnowledge
- Optometrics
- OptoTech Optical Machinery Inc
- OptoTest
- OptoTherm Inc
- Optronic Laboratories Inc
- Pepperl & Fuchs Inc
- Photon Kinetics
- Physical Sciences Inc
- PI
- Ramco Innovations Inc
- Redondo Optics
- Reflex Analytical Corporation
- RWC Testing & Lab Supplies
- Scientific Computing International
- Shimadzu Scientific Instruments Inc Sub of Shimadzu Corp
- SICK Inc
- Spectra Services
- Spectraline Inc
- Star Tech Instruments
- Starna Cells Inc
- Sunrise Optical LLC
- Surface Optics Corp
- Taylor Hobson Precision
- Terasense Group
- The Microscope Depot
- Tiger Optics LLC
- Translume Inc
- TrueGage
- Unitron Ltd
- USA Borescopes
- VIEW Micro-Metrology
- Wilcom Inc
- Wilks - a Spectro Scientific Co
- World Precision Instruments
- WPI
- XIA LLC
- Zarbeco
- Zemetrics
- Pranalytica, Inc
- Pembroke Instruments, LLC
- Del Mar Photonics
- Photon Control Inc.
- 4D Technology
- AFL
- B&W Tek, Inc.
- BaySpec
- Bristol Instruments
- Broadcom
- 相干公司
- DeNovix
- Deviser Instruments
- Gamma Scientific
- Jonard Tools
- Keysight Technologies
- Leonardo Electronics US
- LIGHTEL
- MKS | Newport
- Ocean Insight
- OEwaves
- OSI Optoelectronics
- PerkinElmer Inc
- Pratt & Whitney Measurement Systems
- Precision Rated Optics
- Teledyne Princeton Instruments
- Quantum Composers, Inc.
- Special Optics
- Spectral Products
- Spectrolight, Inc.
- Spectrum Scientific, Inc
- StellarNet Inc
- Sutter Instrument
- TecOptics, Inc.
- Thermo Fisher Scientific
- 索雷博
- Titan Tool Supply
- Ultrafast Systems
- VEE GEE Scientific, Inc
- Verity Instruments, Inc.
- Vermont Photonics
- Viavi Solutions Inc.
- Wasatch Photonics
- Zygo Corporation
- Scientech Inc
- Altos Photonics, Inc.
- PureAire Monitoring Systems Inc
- QED Technologies Inc
- Solid State Cooling Systems
- Resonance
- DataRay
- Leonardo DRS
光电查为您提供6个产品。下载资料，获取报价，实现功能、价格及供应的优化选择。
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干涉仪配置: Not Specified 光源: 543nm 输出极化: Not Specified 有效值重复性: Not Specified 有效值精度: Not Specified通常，基于多棱镜扩束和数字检测，狭缝干涉仪允许透射光学表面的快速干涉测量表征。与传统的逐点非相干显微密度计和逐点非相干显微镜相比，这是一个显著的进步。
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干涉仪配置: Not Specified 光源: 543nm 输出极化: Not Specified 有效值重复性: Not Specified 有效值精度: Not Specified通常，基于多棱镜扩束和数字检测，狭缝干涉仪允许透射光学表面的快速干涉测量表征。与传统的逐点非相干显微密度计和逐点非相干显微镜相比，这是一个显著的进步。
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干涉仪配置: Not Specified 光源: 594nm 输出极化: Not Specified 有效值精度: Not Specified通常，基于多棱镜扩束和数字检测，狭缝干涉仪允许透射光学表面的快速干涉测量表征。与传统的逐点非相干显微密度计和逐点非相干显微镜相比，这是一个显著的进步。
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干涉仪配置: Not Specified 光源: 594nm 输出极化: Not Specified 有效值重复性: Not Specified 有效值精度: Not Specified通常，基于多棱镜扩束和数字检测，狭缝干涉仪允许透射光学表面的快速干涉测量表征。与传统的逐点非相干显微密度计和逐点非相干显微镜相比，这是一个显著的进步。
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干涉仪配置: Not Specified 光源: 632 nm or 633nm 输出极化: Not Specified 有效值重复性: Not Specified 有效值精度: Not Specified通常，基于多棱镜扩束和数字检测，狭缝干涉仪允许透射光学表面的快速干涉测量表征。与传统的逐点非相干显微密度计和逐点非相干显微镜相比，这是一个显著的进步。
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干涉仪配置: Not Specified 光源: 632 nm or 633nm 输出极化: Not Specified 有效值重复性: Not Specified 有效值精度: Not Specified通常，基于多棱镜扩束和数字检测，狭缝干涉仪允许透射光学表面的快速干涉测量表征。与传统的逐点非相干显微密度计和逐点非相干显微镜相比，这是一个显著的进步。