- DataRay
- 干涉仪(115)
- 激光功率计(240)
- 单色仪(11)
- 光学延迟线(20)
- 光功率计(64)
- 光谱分析仪(111)
- 光波长计(35)
- 光谱仪(877)
- 激光雷达(29)
- 扫描仪和测距仪(24)
- 气体分析(47)
- 光学池(79)
- 光束分析仪配件(20)
- 光束分析仪(46)
- 激光能量计(82)
- 普通显微镜(60)
- 显微镜配件(25)
- 位移测量计(17)
- 计量配件(19)
- 光学表面轮廓仪(17)
- 孔探仪(39)
- 脉冲发生器(21)
- 太赫兹成像(4)
- 太赫兹时域(13)
- 其他分类测量仪器(19)
- 光纤检测工具(28)
- 脉冲诊断器件(30)
- 激光扫描和测距(9)
- 光束分析(5)
- 光学检测(14)
- 显微镜(12)
- 光纤测试与测量(3)
- 尺寸测量(1)
- 散热解决方案(20)
- 3-Edge
- Advanced Energy
- Advanced Scientific Concepts
- Aerotech
- Allied High Tech Products
- Ancal Inc
- Angstrom Inc
- AP Technologies Ltd
- Applied Analytics Inc
- Applied NanoFluorescence LLC
- Applied Research & Photonics Inc
- Applied Rigaku Technologies Inc Div of Rigaku Corp
- Armstrong Optical
- ASD Inc Div of Malvern Panalytical Inc
- Bakman Technologies
- Berkeley Nucleonics Corp
- Bodkin Design and Engineering
- Brandywine Photonics
- Bridger Photonics Inc
- Capacitec Inc
- Capovani Brothers Inc
- Cargille Labs
- Carl Zeiss Microscopy LLC
- Cascade Technologies
- Catalina Scientific Instruments
- CE Optics Ltd
- Channel Systems Inc
- Complete Inspection Systems Inc
- Connected Fibers
- Data-Pixel
- DFM Engineering Inc
- Digital Surf
- Direct Optical Research Co
- D&P Instruments
- Dr Heinrich Schneider Messtechnik GmbH
- Dunwell Tech
- 爱特蒙特光学
- EKSPLA
- Eltec Instruments Inc
- ENMET
- EVK DI Kerschhaggl GmbH
- Femtochrome Research Inc
- Fischer Technology Inc
- Fiso Technologies Inc
- FOGALE Nanotech
- Fort Wayne Wire Die Inc
- Luna Innovations
- GenScope
- GigaMat Technologies Inc
- GMP SA
- GOW-MAC Instrument Co
- Gradient Lens Corporation
- Guided Wave Inc
- Hanamura Optics Corp
- HÜBNER Photonics
- Heliotis AG
- Hiden Analytical
- Highland Technology
- Hofbauer Optik Mess- & Prüftechnik
- ID Photonics GmbH
- Idealab Inc
- Infinity Photo-Optical
- Inometrix Inc
- InPhotonics Inc
- INSION GmbH
- Interferometric Optics
- International Light Technologies
- Interspectrum OU
- Intracellular Imaging
- ISS Inc
- JADAK, a Novanta Co
- JEOL USA Inc
- JETI Technische Instrumente GmbH
- Kaiser Optical Systems Inc
- Kasalis
- L3Harris Technologies, Inc.
- Kiyohara Optics USA
- Kylia
- Laser Probe Inc
- LaserPoint Srl
- Leica Microsystems Inc
- Lenox Instrument Co
- Level Five Supplies
- LI-COR Inc
- Lion Precision
- Logos Systems
- LOT-QuantumDesign GmbH
- M3 Measurement Solutions
- Macken Instruments Inc
- Mad City Labs
- Martin Froeschner & Associates
- Max Levy Autograph Inc
- MBF Bioscience
- McBain Systems
- McPherson
- Mesa Photonics LLC
- Metrohm USA
- Metrolux GmbH
- MicroVision Inc
- Midac Corp
- Montana Instruments Corp
- Motic Instruments
- NANOVEA
- Nedinsco BV
- Next Instruments
- Nikon Instruments
- NTT Advanced Technology Corp
- OAI
- OLIS Inc
- Ono Sokki Technology Inc
- Optical Data Associates LLC
- Optical Perspectives Group, LLC
- Optical Wavelength Laboratories
- Optimark Fiber Optics
- Optodyne Inc
- OptoKnowledge
- OPTOKON AS
- Optometrics
- OptoTech Optical Machinery Inc
- OptoTest
- OptoTherm Inc
- Optronic Laboratories Inc
- Oxford Instruments
- OZ Optics
- PCE Instruments UK Ltd Sub of PCE Holding GmbH
- PE Schall GmbH & Co KG
- Pepperl & Fuchs Inc
- Petrolaser Co
- Phantom Intelligence
- Phase Photonics
- Photon etc.
- Photon Kinetics
- Photonics Technology Obninsk Ltd (PhTO Ltd)
- Physical Sciences Inc
- PI
- PicoQuant
- Polytec GmbH
- P&P Optica
- Promax Electronica
- Rainbow Photonics AG
- Ramco Innovations Inc
- Redondo Optics
- Reflex Analytical Corporation
- RIEGL
- RWC Testing & Lab Supplies
- Scantron Industrial Products Ltd
- Scientific Computing International
- Scope Technology
- Sensapex Ltd
- SensUp
- Si-Ware Systems
- SICK Inc
- SmarAct
- Spectra Services
- Spectraline Inc
- Spectrolab Systems
- Spectrum Metrology Ltd
- Star Tech Instruments
- Starna Cells Inc
- Sunrise Optical LLC
- Surface Optics Corp
- Taylor Hobson Precision
- TecSense GmbH
- Terasense Group
- The Microscope Depot
- Tiger Optics LLC
- TimeGate Instruments
- Translume Inc
- TrueGage
- Unitron Ltd
- USA Borescopes
- VIEW Micro-Metrology
- Wilcom Inc
- Wilks - a Spectro Scientific Co
- World Precision Instruments
- WPI
- XIA LLC
- Yelo Ltd
- Zarbeco
- Zemetrics
- Zeutec Opto-Elektronik GmbH
- Pranalytica, Inc
- Hangzhou Brolight Technology Co., Ltd
- Pembroke Instruments, LLC
- DIGCO® Inc.
- HANGZHOU OLE-SYSTEMS
- GMCH TECH (SHENZHEN) CO.,LTD
- greenTEG AG
- Del Mar Photonics
- Photon Control Inc.
- 4D Technology
- ADC Corporation
- Admesy
- AeroDIODE
- AFL
- 牛津仪器
- 安立公司
- 安东帕
- APE Angewandte Physik & Elektronik GmbH
- Arden Photonics
- Artifex Engineering GmbH & Co. KG
- Avantes
- Avesta Ltd.
- B&W Tek, Inc.
- BaySpec
- Bristol Instruments
- Broadcom
- Cairn Research
- 相干公司
- DeNovix
- Deviser Instruments
- Duma Optronics
- Edinburgh Instruments
- 法兰克福激光公司
- Gamma Scientific
- Gentec-EO
- GoyaLab
- HP Spectroscopy
- Hamamatsu Photonics
- HighFinesse
- IB Photonics
- Ibsen Photonics
- IDIL Fibres Optiques
- Instrument Systems
- IRsweep
- IS Instruments
- ISTEQ
- iXblue Photonics
- Jonard Tools
- Keysight Technologies
- Laser Components
- Leonardo Electronics US
- Light Conversion
- LightMachinery
- LIGHTEL
- Luxmux
- Menlo Systems
- Micro-Epsilon
- MKS | Newport
- NLIR
- Ocean Insight
- OEwaves
- MKS | Ophir
- Optilab
- OSI Optoelectronics
- OZ Optics Ltd.
- PerkinElmer Inc
- PIKE Technologies
- Pratt & Whitney Measurement Systems
- Precision Rated Optics
- PRIMES
- Teledyne Princeton Instruments
- Quantum Composers, Inc.
- Radiantis
- RESOLUTION Spectra Systems
- RFOptic
- RGB Photonics
- Shimadzu
- Special Optics
- Spectral Products
- Spectrolight, Inc.
- SphereOptics GmbH
- Spectrum Scientific, Inc
- STANDA
- StellarNet Inc
- STEMMER IMAGING
- Sutter Instrument
- TecOptics, Inc.
- Thermo Fisher Scientific
- 索雷博
- Titan Tool Supply
- TOPAG Lasertechnik GmbH
- TOPTICA Photonics
- TRIOPTICS GmbH
- Ultrafast Systems
- VEE GEE Scientific, Inc
- Verity Instruments, Inc.
- Vermont Photonics
- Viavi Solutions Inc.
- Wasatch Photonics
- World Star Tech
- XONOX Technology GmbH
- Yokogawa Electric Corporation
- Zygo Corporation
- Semilab Semiconductor Physics Laboratory
- 布鲁克光谱仪器公司
- 新拓三维
- 岛津中国
- Scientech Inc
- Promet Optics
- Altos Photonics, Inc.
- PureAire Monitoring Systems Inc
- QED Technologies Inc
- Solid State Cooling Systems
- 罗杰斯
- Resonance
- DataRay
- ARCoptix
- RedWave Labs Ltd
- Leonardo DRS
- 昊亮光电
- 海洋光学
光电查为您提供29个产品。下载资料,获取报价,实现功能、价格及供应的优化选择。
-
传感器类型: CMOS 可衡量的来源: CW, Pulsed 波长范围: 355 - 1150 nm # 像素(宽度): 2048 # 像素(高度): 2048
大光束仿形系统是一种完整的解决方案,通过用光束照射旋转的漫反射表面,并使用高质量透镜将强度分布重新成像到相机传感器上,从而测量大光束。LBPS剖面仪通过消除散斑的影响、计算精确的像素倍增因子以及校正几何光束失真,克服了该方法的典型问题。大型光束仿形-直径可达200 mm。LBPS与Dataray的全功能、高度可定制、以用户为中心的软件兼容,该软件无许可费、无限制安装和免费软件更新。LBPS中使用的传感器是Dataray的旗舰产品WinCAMD-LCM4光束仿形相机。LBPS扩展了其测量大型波束的能力。
-
传感器类型: CMOS 可衡量的来源: CW, Pulsed 波长范围: 190 - 1150 nm # 像素(宽度): 2048 # 像素(高度): 2048
线激光剖面测量系统(LLPS)是一套完整的解决方案,用于分析长达200 mm、宽至55µm的线激光。通过使用我们的200 mm线性载物台在光束长度上扫描Dataray的旗舰WinCAMD-LCM4光束轮廓相机,全功能免费软件将显示线激光强度分布的完整图像,以及垂直质心图、线宽图和其他几个有用的测量结果。线激光仿形–长达200毫米线激光仿形系统由Dataray的全功能、高度可定制、以用户为中心的软件支持,该软件无许可费、无限制安装和免费软件更新。软件控制载物台的移动,自动配置线激光扫描的较佳曝光时间,并提供线的分析。
-
传感器类型: CMOS 可衡量的来源: CW, Pulsed 波长范围: 190 - 1150 nm # 像素(宽度): 2048 # 像素(高度): 2048
线激光剖面测量系统(LLPS)是一套完整的解决方案,用于分析长达200 mm、宽至55µm的线激光。通过使用我们的200 mm线性载物台在光束长度上扫描Dataray的旗舰WinCAMD-LCM4光束轮廓相机,全功能免费软件将显示线激光强度分布的完整图像,以及垂直质心图、线宽图和其他几个有用的测量结果。线激光仿形–长达200毫米线激光仿形系统由Dataray的全功能、高度可定制、以用户为中心的软件支持,该软件无许可费、无限制安装和免费软件更新。软件控制载物台的移动,自动配置线激光扫描的较佳曝光时间,并提供线的分析。
-
传感器类型: Microbolometer 可衡量的来源: CW, Pulsed 波长范围: 2000 - 16000 nm # 像素(宽度): 640 # 像素(高度): 480
WinCAMD-IR-BB激光光束轮廓仪是一种用于中波红外和远红外范围激光的成像解决方案。WinCAMD-IR-BB光束轮廓仪具有17µm像素、2-16µm波长范围和集成快门,可提供无与伦比的光束轮廓能力。WinCAMD-IR-BB的信噪比超过1000:1,可进行符合ISO11146标准的光束测量。基于微测辐射热计的相机具有非常高的灵敏度,集成的快门允许全自动非均匀性校正。WinCAMD-IR-BB激光束剖面仪由Dataray的全功能、高度可定制、以用户为中心的软件提供支持,该软件无许可费、无限制安装和免费软件更新。该软件支持使用我们的M2DU阶段进行M^2测量。对于更高功率的激光器,Dataray提供了一系列采样、吸收和反射衰减器,用于超过相机较大功率的光束。功率限制。
-
传感器类型: CMOS 可衡量的来源: CW, Pulsed 波长范围: 355 - 1150 nm # 像素(宽度): 2048 # 像素(高度): 2048
Dataray WinCAMD-LCM CMOS激光束分析仪提供USB 3.0传输速率和高分辨率1英寸。探测器适用于从OEM集成到R&D的各种应用。这款光束轮廓仪可在190至1605 nm范围内使用,在2048×2048有效面积内提供5.5µm像素,更新速率高达60 Hz,并具有光学/TTL(晶体管-晶体管逻辑)触发器。CMOS探测器消除了彗星拖尾,全局快门和触发使能脉冲捕获。USB 3.0接口配有专有的可定制软件。该激光束剖面仪的应用包括CW和脉冲激光剖面仪、激光系统的现场维修、光学组件、仪器校准、光束漂移和记录、质量控制以及使用可用的200 mm平移台进行m²测量。