- XIA LLC
- 干涉仪(115)
- 激光功率计(239)
- 单色仪(11)
- 光学延迟线(14)
- 光功率计(64)
- 光谱分析仪(104)
- 光波长计(35)
- 光谱仪(875)
- 激光雷达(29)
- 扫描仪和测距仪(24)
- 气体分析(47)
- 光学池(79)
- 光束分析仪配件(20)
- 光束分析仪(46)
- 激光能量计(82)
- 普通显微镜(60)
- 显微镜配件(25)
- 位移测量计(17)
- 计量配件(19)
- 光学表面轮廓仪(17)
- 孔探仪(39)
- 脉冲发生器(20)
- 太赫兹成像(4)
- 太赫兹时域(13)
- 其他分类测量仪器(19)
- 光纤检测工具(28)
- 脉冲诊断器件(30)
- 激光扫描和测距(9)
- 光束分析(5)
- 光学检测(14)
- 显微镜(12)
- 光纤测试与测量(3)
- 尺寸测量(1)
- 散热解决方案(20)
- 3-Edge
- Advanced Energy
- Advanced Scientific Concepts
- Aerotech
- Allied High Tech Products
- Ancal Inc
- Angstrom Inc
- Applied Analytics Inc
- Applied NanoFluorescence LLC
- Applied Research & Photonics Inc
- Applied Rigaku Technologies Inc Div of Rigaku Corp
- Armstrong Optical
- ASD Inc Div of Malvern Panalytical Inc
- Bakman Technologies
- Berkeley Nucleonics Corp
- Bodkin Design and Engineering
- Brandywine Photonics
- Bridger Photonics Inc
- Capacitec Inc
- Capovani Brothers Inc
- Cargille Labs
- Carl Zeiss Microscopy LLC
- Cascade Technologies
- Catalina Scientific Instruments
- CE Optics Ltd
- Channel Systems Inc
- Complete Inspection Systems Inc
- Connected Fibers
- Data-Pixel
- DFM Engineering Inc
- Digital Surf
- Direct Optical Research Co
- D&P Instruments
- Dr Heinrich Schneider Messtechnik GmbH
- Dunwell Tech
- 爱特蒙特光学
- EKSPLA
- Eltec Instruments Inc
- ENMET
- EVK DI Kerschhaggl GmbH
- Femtochrome Research Inc
- Fischer Technology Inc
- Fiso Technologies Inc
- FOGALE Nanotech
- Fort Wayne Wire Die Inc
- Luna Innovations
- GenScope
- GigaMat Technologies Inc
- GMP SA
- GOW-MAC Instrument Co
- Gradient Lens Corporation
- Guided Wave Inc
- Hanamura Optics Corp
- HÜBNER Photonics
- Heliotis AG
- Hiden Analytical
- Highland Technology
- Hofbauer Optik Mess- & Prüftechnik
- Idealab Inc
- Infinity Photo-Optical
- Inometrix Inc
- InPhotonics Inc
- INSION GmbH
- Interferometric Optics
- International Light Technologies
- Interspectrum OU
- Intracellular Imaging
- ISS Inc
- JADAK, a Novanta Co
- JEOL USA Inc
- JETI Technische Instrumente GmbH
- Kaiser Optical Systems Inc
- Kasalis
- L3Harris Technologies, Inc.
- Kiyohara Optics USA
- Kylia
- Laser Probe Inc
- LaserPoint Srl
- Leica Microsystems Inc
- Lenox Instrument Co
- Level Five Supplies
- LI-COR Inc
- Lion Precision
- Logos Systems
- LOT-QuantumDesign GmbH
- M3 Measurement Solutions
- Macken Instruments Inc
- Mad City Labs
- Martin Froeschner & Associates
- Max Levy Autograph Inc
- MBF Bioscience
- McBain Systems
- McPherson
- Mesa Photonics LLC
- Metrohm USA
- Metrolux GmbH
- MicroVision Inc
- Midac Corp
- Montana Instruments Corp
- Motic Instruments
- NANOVEA
- Nedinsco BV
- Next Instruments
- Nikon Instruments
- NTT Advanced Technology Corp
- OAI
- OLIS Inc
- Ono Sokki Technology Inc
- Optical Data Associates LLC
- Optical Perspectives Group, LLC
- Optical Wavelength Laboratories
- Optimark Fiber Optics
- Optodyne Inc
- OptoKnowledge
- OPTOKON AS
- Optometrics
- OptoTech Optical Machinery Inc
- OptoTest
- OptoTherm Inc
- Optronic Laboratories Inc
- Oxford Instruments
- OZ Optics
- PCE Instruments UK Ltd Sub of PCE Holding GmbH
- PE Schall GmbH & Co KG
- Pepperl & Fuchs Inc
- Petrolaser Co
- Phantom Intelligence
- Phase Photonics
- Photon etc.
- Photon Kinetics
- Photonics Technology Obninsk Ltd (PhTO Ltd)
- Physical Sciences Inc
- PI
- PicoQuant
- Polytec GmbH
- P&P Optica
- Promax Electronica
- Rainbow Photonics AG
- Ramco Innovations Inc
- Redondo Optics
- Reflex Analytical Corporation
- RIEGL
- RWC Testing & Lab Supplies
- Scantron Industrial Products Ltd
- Scientific Computing International
- Scope Technology
- Sensapex Ltd
- SensUp
- Si-Ware Systems
- SICK Inc
- SmarAct
- Spectra Services
- Spectraline Inc
- Spectrolab Systems
- Spectrum Metrology Ltd
- Star Tech Instruments
- Starna Cells Inc
- Sunrise Optical LLC
- Surface Optics Corp
- Taylor Hobson Precision
- TecSense GmbH
- Terasense Group
- The Microscope Depot
- Tiger Optics LLC
- TimeGate Instruments
- Translume Inc
- TrueGage
- Unitron Ltd
- USA Borescopes
- VIEW Micro-Metrology
- Wilcom Inc
- Wilks - a Spectro Scientific Co
- World Precision Instruments
- WPI
- XIA LLC
- Yelo Ltd
- Zarbeco
- Zemetrics
- Zeutec Opto-Elektronik GmbH
- Pranalytica, Inc
- Hangzhou Brolight Technology Co., Ltd
- Pembroke Instruments, LLC
- DIGCO® Inc.
- HANGZHOU OLE-SYSTEMS
- GMCH TECH (SHENZHEN) CO.,LTD
- greenTEG AG
- Del Mar Photonics
- Photon Control Inc.
- 4D Technology
- ADC Corporation
- Admesy
- AeroDIODE
- AFL
- 牛津仪器
- 安立公司
- 安东帕
- APE Angewandte Physik & Elektronik GmbH
- Arden Photonics
- Artifex Engineering GmbH & Co. KG
- Avantes
- Avesta Ltd.
- B&W Tek, Inc.
- BaySpec
- Bristol Instruments
- Broadcom
- Cairn Research
- 相干公司
- DeNovix
- Deviser Instruments
- Duma Optronics
- Edinburgh Instruments
- 法兰克福激光公司
- Gamma Scientific
- Gentec-EO
- GoyaLab
- HP Spectroscopy
- Hamamatsu Photonics
- HighFinesse
- IB Photonics
- Ibsen Photonics
- IDIL Fibres Optiques
- Instrument Systems
- IRsweep
- IS Instruments
- ISTEQ
- iXblue Photonics
- Jonard Tools
- Keysight Technologies
- Laser Components
- Leonardo Electronics US
- Light Conversion
- LightMachinery
- LIGHTEL
- Luxmux
- Menlo Systems
- Micro-Epsilon
- MKS | Newport
- NLIR
- Ocean Insight
- OEwaves
- MKS | Ophir
- Optilab
- OSI Optoelectronics
- OZ Optics Ltd.
- PerkinElmer Inc
- PIKE Technologies
- Pratt & Whitney Measurement Systems
- Precision Rated Optics
- PRIMES
- Teledyne Princeton Instruments
- Quantum Composers, Inc.
- Radiantis
- RESOLUTION Spectra Systems
- RFOptic
- RGB Photonics
- Shimadzu
- Special Optics
- Spectral Products
- Spectrolight, Inc.
- SphereOptics GmbH
- Spectrum Scientific, Inc
- STANDA
- StellarNet Inc
- STEMMER IMAGING
- Sutter Instrument
- TecOptics, Inc.
- Thermo Fisher Scientific
- 索雷博
- Titan Tool Supply
- TOPAG Lasertechnik GmbH
- TOPTICA Photonics
- TRIOPTICS GmbH
- Ultrafast Systems
- VEE GEE Scientific, Inc
- Verity Instruments, Inc.
- Vermont Photonics
- Viavi Solutions Inc.
- Wasatch Photonics
- World Star Tech
- XONOX Technology GmbH
- Yokogawa Electric Corporation
- Zygo Corporation
- Semilab Semiconductor Physics Laboratory
- 布鲁克光谱仪器公司
- 新拓三维
- 岛津中国
- Scientech Inc
- Promet Optics
- Altos Photonics, Inc.
- PureAire Monitoring Systems Inc
- QED Technologies Inc
- Solid State Cooling Systems
- 罗杰斯
- Resonance
- DataRay
- ARCoptix
- RedWave Labs Ltd
- Leonardo DRS
- 昊亮光电
- 海洋光学
光电查为您提供3个产品。下载资料,获取报价,实现功能、价格及供应的优化选择。
-
测量类型: Elemental analysis 最低电平检测: 1 - 4 ppm 决议: 180eV
当今的许多数字脉冲处理器即使在低计数率下也会出现脉冲堆积。Falconx仪器使用强大的Sitoro®算法,即使在高计数率下也能准确处理几乎所有检测到的辐射事件,恢复其他脉冲处理器丢弃的数据,并提供卓越的光谱质量。因此,可以在高计数率下实现前所未有的吞吐量。例如,在1 MCPs输出时仅有12%的停滞时间,较大输出计数率约为4 MCPs。FalconX8的分析速度比传统脉冲处理器快得多,从低到高计数率的分辨率下降较小。FalconX8无需在计数率范围内调整成形时间,并可灵活优化分析,以获得较高分辨率、较高吞吐量或两者的组合,以及低于30纳秒的出色脉冲对分辨率。FalconX8可提供1至8个激活通道。对于较大的系统,可以在快速网络上轻松组合多个单元,并可选择干净的机架安装。Xia在设计FalconX8时考虑到了简单性和灵活性。它结构紧凑,高度便携,开箱即可与几乎所有探测器兼容,并且只需较少的设置。
-
测量类型: Elemental analysis, Contaminant detection and analysis, Chemical identification 最低电平检测: 1 - 2 ppm 决议: 150000eV
DXP Mercury将高速数字脉冲处理器封装在带有内置电源的紧凑桌面盒中。峰化时间范围为0.1至160µs,频谱中的较大输出(较短峰化时间)高达1Mcps。DXP Mercury具有出色的噪声性能,适用于使用单个探测器或多元素探测器阵列的扩展能量范围0.1-100 Kev及以上的高分辨率光谱学。Mercury处理器提供对所有放大器和光谱仪设置的计算机控制,包括增益、峰值时间和堆积检查标准。与模拟系统相比,梯形数字滤波器以相当的能量分辨率实现了显著增强的吞吐量。能量分辨率几乎与计数率无关,直到较大吞吐量(63%停滞时间)。完整的计算机界面允许所有数据收集和校准操作实现自动化。数据可以保存在多达16K通道的全频谱中,也可以保存在多达32个感兴趣区域(ROI)中,并在不中断数据收集的情况下传递给主机。DXP Mercury可与各种极性的复位型前置放大器配合使用。提供多种定时模式,包括具有完整MCA读数或多个ROI的快速扫描。即使在数据采集期间,板载内存管理器也可提供对数据的完全访问。对于具有快速扫描的死区操作,存储器可以被组织成两个独立的块,允许在一个块被填充的同时读出另一个块。USB2接口的峰值读出速度超过16 MB/秒。
-
测量类型: Other 最低电平检测: 1 - 4 ppm 决议: 150000eV
DXP xMAP将4个高速数字信号处理器封装到一个紧凑的3U PXI/CPCI模块中。每个处理器提供0.1-100µs的峰值时间范围,可向频谱输出高达1,000,000 CPS。DXP xMAP具有出色的噪声性能,非常适合在0.1-100 Kev的扩展范围内使用具有任何增益的前置放大器的多元件探测器阵列进行能量色散X射线测量。它提供对所有放大器和光谱仪控制的计算机控制,包括增益、峰值时间和堆积检查标准。与模拟系统相比,xMAP的梯形数字FIR滤波器以相当的能量分辨率实现了显著增强的数据吞吐量,但每个探测器的成本更低。直到较大吞吐量,能量分辨率几乎与计数率无关。完整的计算机接口允许所有数据收集和校准操作自动化,大大降低了人为错误的可能性。数据可以被收集到多达8K通道或多达32个感兴趣区域(ROI)的全频谱中,并在不停止数据收集的情况下传递到主机。全谱存储允许在逐个检测器的基础上执行峰化拟合和/或去卷积,从而导致更准确的强度提取,特别是在散射峰随能量快速变化的情况下。DXP xMAP可轻松与各种常见的复位型检波器/前置放大器系统配合使用。有几种计时模式,包括具有完整MCA读数或多个ROI的快速扫描,以及列表模式读数,其中为每个事件存储时间和能量。即使在数据采集期间,板载内存管理器也允许完全访问数据。对于具有快速扫描的死时间操作,存储器可以被组织成两个独立的存储体,允许读出一个存储体,而另一个存储体被填充。PCI接口上的峰值读取速度超过100 MB/秒。