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Semilab 提供的 SE-2000 是一种独有的模块化光学平台，配备有旋转补偿器光学元件的分光椭偏仪。它可以对单层和多层样品以及基片进行非接触式和非破坏性光学测量，从而获得单独的薄膜厚度和光学特性。