- Sydor Instruments LLC
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- ABS GmbH
- Active Silicon Inc
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- Advanced Imaging Concepts
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- Dage-MTI of Michigan City
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- DOEHRER Elektrooptik GmbH
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- Dr Heinrich Schneider Messtechnik GmbH
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- E-con Systems
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- 爱特蒙特光学
- EKLUND INFRARED Inc
- Eldim
- Electron National Research Institute
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- EURESYS
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- LabSmith Inc
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- Laserand
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- Marshall Electronics
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- MG Optical Solutions GmbH
- MicroImage Video Systems
- Microscope Vision And Image Analysis (MVIA)
- Midwest Information Systems Inc (MIS)
- Mightex Systems
- Mikrosens
- Mikrotron
- Monroe Infrared Technology Inc
- Motion Analysis Inc
- MoviTHERM Thermography Solutions
- MRC Systems GmbH
- Multipix Imaging Components
- MVTec Software GmbH
- nac Image Technology
- NET - New Electronic Technology
- New England Optical Systems Inc - NEOS
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- Optikos Corp
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- Optris
- Optronis GmbH
- Panavision SVI LLC
- PathPartner Technology
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- PCE Instruments UK Ltd Sub of PCE Holding GmbH
- PCO
- PE Schall GmbH & Co KG
- Perfect Prime
- Phase 1 Technology Corporation
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- Pixelink
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- PolarisUSA
- Princeton Infrared Technologies
- Process Sensors Corp
- Quantum Scientific Imaging Inc
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- Rauscher GmbH
- Reed Instruments
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- Sony Europe
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- Stanford Photonics Inc
- Sundance DSP
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- Sydor Instruments LLC
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- Systematic Vision Corp
- Talktronics Inc
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- Pembroke Instruments, LLC
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- Emergent Vision Technologies, Inc.
- Excelitas Technologies
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- NP Photonics, Inc.
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- Panasonic Corporation
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光电查为您提供2个产品。下载资料,获取报价,实现功能、价格及供应的优化选择。
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传感器类型: CCD 检测方法: Direct Detection # 像素(宽度): 1920 # 像素(高度): 960 像素大小: 30um
Sydor Fast CCD是一款革命性的高速、超高量子效率、低噪声相机,用于探测软X射线。直接检测消除了信号丢失的风险,当将X射线转换为可由可见摄像机检测的信号时,经常会遇到这种风险。Sydor的快速CCD提供了这些优势,以及比竞争对手的直接检测相机系统快约100倍的图像采集速度。在这些速率下的成像允许在样品经历X射线损伤之前收集数据。高帧速率被耦合到具有低噪声和快速传输速度的光纤输出。耗尽接触非常薄,以实现从<100eV到1000eV的高QE。传感器可以被完全耗尽,防止残余电荷载流子破坏流数据,并导致高收集效率。专有的耗尽触点在100 eV时显示出>75%的QE,对于600 eV以上的光子,显示出超过98%的QE。用户可以采用突发模式以获得更快的输出,这可能是某些类型的激光器和半导体研究所需的。这种增加的速度和QE允许在更短的时间内收集更多的数据,使通常稀缺的波束时间的价值较大化。照相机系统可以被设计成在两种可用模式-全帧模式或1K模式中的一种下操作。在全帧模式下,使用完整的960 X 1920传感器,并以60 FPS的速度进行采集。在1K模式下,活动成像区域为960 X 960像素,采集速度为120 FPS。
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传感器类型: CCD 检测方法: Direct Detection # 像素(宽度): 1920 # 像素(高度): 960 像素大小: 5um
在RIXS中,至关重要的是,每一个能够被探测到的光子都能以尽可能高的光谱分辨率被探测到。Sydor提供较小的分辨率,由5um像素提供,与较低的噪声和较高的QE匹配,用于直接X射线检测-甚至用于超软X射线领域。在RIXS实验中,可分辨的不同能量的分辨率与计算散射角的精确程度直接相关。因此,光子在探测器上的撞击可以多好地被解析为空间位置的精度定义了实验的精度。Sydor Spectro CCD使用5um像素尺寸和间距解决了这个问题,这代表了目前为RIXS实施的其他探测器的三倍改进。为了进一步提高分辨率,并适应已经在探测器上配置了倾斜焦平面的光谱仪,Sydor Spectro CCD现在可以使用倾斜芯片。这允许探测器与光谱仪的倾斜度相匹配。也可以通过倾斜法兰安装来进行一些倾斜调整。Sydor Spectro CCD的所有配置都采用了专有的超薄背面触点,与软X射线领域的竞争解决方案相比,它在所有领域都提供了更好的QE。对于新的RIXS光谱仪设计,可以利用Sydor Spectro CCD提供的额外分辨率来获得实验能力,并减少光谱仪臂的总长度。减小臂长度可以显著节省尺寸稳定性并降低制造成本。Sydor Technologies提供全系列的直接X射线探测器和金刚石光束位置监测器。这些产品加入了我们广受欢迎的罗斯条纹相机、皮秒门控光学成像仪、脉冲扩张光电倍增管等产品系列。